Details
Siglent SDS5000L Series Digital Storage Oscilloscope
Bandwidth
1 GHz
Real time sampling rate
5 GSa/s
Channels
8 + EXT
Product Introduction
SDS5000L are available in 8 channels, bandwidths of 350 MHz, 500 MHz and 1 GHz, have 12-bit ADCs with sample rate up to 5 GSa/s, maximum record length of 2.5 Gpts/ch. Multiple SDS5000L modules can be synchronized using a 64-channel distributor (SYN64) to form a high-channel-count acquisition system scalable up to 512 channels.
Key Features
Product advantage
Multi-channel timing test, power rail measurement completed in one go
Modern electronic systems incorporate various chips and modules whose initialization and operation may interfere with each other. Power-up sequence testing ensures that signals from different circuit modules follow the correct timing to avoid conflicts and guarantee system stability. For example, improper power-up sequences in communication systems can lead to data transmission errors. As circuit complexity increases, so do the challenges of power-up testing. The SDS5000L captures the entire power-up process of all relevant signals in a single acquisition, reducing measurement time, improving efficiency, and minimizing errors caused by repeated tests. For complex circuits with 8 power rails, this capability enables one-shot measurements.
Three-Phase Power Analysis
Using an 8-channel oscilloscope for three-phase power analysis allows simultaneous connection to all phases. It synchronously measures three-phase voltage and current signals, accurately capturing waveforms and parameters in real time. Users can directly observe and compare phase relationships to ensure balance. With the Fast Fourier Transform (FFT) function, multi-channel oscilloscopes perform harmonic analysis on three-phase signals. Optional three-phase analysis software supports vector diagram testing for motors, power quality assessment, ripple analysis, and efficiency evaluation.
Complete Wide Bandgap Semiconductor Testing Solution
The launch of Siglent latest 8-channel oscilloscopes and optically isolated probes completes the final piece of the wide bandgap semiconductor testing puzzle. The SDS5000L achieves a rise time at the picosecond (ps) level, capturing fast-switching waveforms of silicon carbide (SiC) and gallium nitride (GaN) devices. It analyzes transient voltage and current changes during switching, as well as characteristics like overshoot and ringing, to optimize circuit design and signal integrity.
Flexible Multi-channel High-speed Acquisition System with the SDS5000L
The SDS5000L features a compact form factor with a mere 1U height, enabling the construction of flexible multi-channel acquisition systems. Multiple units are combined to create a high-speed acquisition system with up to 512 channels by being triggered with low-skew synchronization signals from the 64-channel synchronization distributor SYN64 The host can access each unit over 1000M LAN. A complete SCPI command set as well as LabVIEW and IVI drivers are provided for easy data acquisition. The LAN port is LXI compliant. Sample clocks are synchronized between all units in the test system by cascading the 10 MHz In and 10 MHz Out clocks in a daisy chain.
Product parameter
Bandwidth
1 GHz
Real time sampling rate
5 GSa/s
Channels
8 + EXT
Product Introduction
SDS5000L are available in 8 channels, bandwidths of 350 MHz, 500 MHz and 1 GHz, have 12-bit ADCs with sample rate up to 5 GSa/s, maximum record length of 2.5 Gpts/ch. Multiple SDS5000L modules can be synchronized using a 64-channel distributor (SYN64) to form a high-channel-count acquisition system scalable up to 512 channels.
Key Features
- Bandwidth：1 GHz, 500 MHz, 350 MHz
- Memory depth： Up to 2.5 Gpts/ch waveform length
- ADC：12-bit
- Real time sampling rate： Up to 5 GSa/s
- Waveform capture rates：Up to 160,000 wfm/s
Product advantage
Multi-channel timing test, power rail measurement completed in one go
Modern electronic systems incorporate various chips and modules whose initialization and operation may interfere with each other. Power-up sequence testing ensures that signals from different circuit modules follow the correct timing to avoid conflicts and guarantee system stability. For example, improper power-up sequences in communication systems can lead to data transmission errors. As circuit complexity increases, so do the challenges of power-up testing. The SDS5000L captures the entire power-up process of all relevant signals in a single acquisition, reducing measurement time, improving efficiency, and minimizing errors caused by repeated tests. For complex circuits with 8 power rails, this capability enables one-shot measurements.
Three-Phase Power Analysis
Using an 8-channel oscilloscope for three-phase power analysis allows simultaneous connection to all phases. It synchronously measures three-phase voltage and current signals, accurately capturing waveforms and parameters in real time. Users can directly observe and compare phase relationships to ensure balance. With the Fast Fourier Transform (FFT) function, multi-channel oscilloscopes perform harmonic analysis on three-phase signals. Optional three-phase analysis software supports vector diagram testing for motors, power quality assessment, ripple analysis, and efficiency evaluation.
Complete Wide Bandgap Semiconductor Testing Solution
The launch of Siglent latest 8-channel oscilloscopes and optically isolated probes completes the final piece of the wide bandgap semiconductor testing puzzle. The SDS5000L achieves a rise time at the picosecond (ps) level, capturing fast-switching waveforms of silicon carbide (SiC) and gallium nitride (GaN) devices. It analyzes transient voltage and current changes during switching, as well as characteristics like overshoot and ringing, to optimize circuit design and signal integrity.
Flexible Multi-channel High-speed Acquisition System with the SDS5000L
The SDS5000L features a compact form factor with a mere 1U height, enabling the construction of flexible multi-channel acquisition systems. Multiple units are combined to create a high-speed acquisition system with up to 512 channels by being triggered with low-skew synchronization signals from the 64-channel synchronization distributor SYN64 The host can access each unit over 1000M LAN. A complete SCPI command set as well as LabVIEW and IVI drivers are provided for easy data acquisition. The LAN port is LXI compliant. Sample clocks are synchronized between all units in the test system by cascading the 10 MHz In and 10 MHz Out clocks in a daisy chain.
Product parameter
| Bandwidth 350 MHz, 500 MHz, 1 GHz |
Channels 8 + EXT |
| Sampling Rate 5 GSa/s |
Vertical Resolution 12-bit |
| Memory Depth 2.5 Gpts/ch |
Capture Rate 650,000 wfm/s |
| I/O I/O: USB 3.0 Host, USB 2.0 Host, USB 3.0 Device (USBTMC), 1000M LAN (VXI-11+SCPI,Telnet (5024)+SCPI, Socket (5025)+SCPI, LXI, WebServer) Display: HDMI Others: External Trigger In, Aux Out (TRIG OUT,PASS/FAIL), 10 MHz In, 10 MHz Out |
Measurement 60+ parameters. Statistics, histogram, trend, and track supported |
| Data analysis Search, Navigate, History, Mask Test, Digital Voltmeter, Counter, Waveform Histogram, Bode plot , Power Analysis, Double Pulse Test |
Trigger type Edge, Slope, Pulse width, Window, Runt, Interval, Dropout, Pattern, Video, Qualified, Nth edge, Setup/hold, Delay, Serial |
| Serial trigger and decode（Standard） Standard：I2C, SPI, UART, CAN, LIN Optional：CAN FD, FlexRay, I2S, MIL-STD-1553B, SENT, Manchester (decode only), ARINC429 |
Digital channel 16 digital channels. Purchase 16-channel logic analyzer probe SPL2016, which can realize 16-channel digital channel acquisition function. |
| Waveform generator The maximum output frequency is 50 MHz. You need to purchase an external signal source (SAG1021I) for use. |
Probe (Standard) SP5150A, 1 probe supplied for each channel |
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