Details
HIOKI RM3542 Resistance HiTester
Measure in as Fast as 0.9 ms, Optimized for Automated Systems
Hioki DC resistance meters measure a broad range of resistance values at a high level of precision. The RM3542 deliver high speed, high precision, and high reliability, indispensable for the shipping inspection of devices such as resistors and EMI components. The resistance meter also supports chip resistor sampling inspections, helping resistor manufacturers improve productivity.
Key Features
Measure in as Fast as 0.9 ms, Optimized for Automated Systems
Hioki DC resistance meters measure a broad range of resistance values at a high level of precision. The RM3542 deliver high speed, high precision, and high reliability, indispensable for the shipping inspection of devices such as resistors and EMI components. The resistance meter also supports chip resistor sampling inspections, helping resistor manufacturers improve productivity.
Key Features
- High speed and accuracy maximize productivity in automated systems
- Multiple checking functions ensure proper contact for reliable measurements
- Low-power resistance mode measures chip inductors and EMC suppression components
- Supports sample inspections during the manufacturing process
Test fixtures are not supplied with the unit. Please select an optional test fixture when ordering.
FEATURES
Ensure reliable contact quickly and reduce the contact error rate with the contact improvement function
The RM3542 improves contact with measurement specimens by eliminating oxide films and dirt between the probes and specimens. By addressing faulty contact, the instrument facilitates stable measurement and reduces the contact error rate, boosting productivity.
Reduce Measurement Time for More Stable Measurements with Integration Time Setting Function
Set the integration time as desired for each range - SHORT to reduce the takt time, or LONG for more stable inspections.
The RM3542 improves contact with measurement specimens by eliminating oxide films and dirt between the probes and specimens. By addressing faulty contact, the instrument facilitates stable measurement and reduces the contact error rate, boosting productivity.
Reduce Measurement Time for More Stable Measurements with Integration Time Setting Function
Set the integration time as desired for each range - SHORT to reduce the takt time, or LONG for more stable inspections.
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